Solutions for Interface Characterization
There may be many types of interfaces in a Solar device: interface between layers in a stack of films, interface with contacts and embedding materials or protective layers. HORIBA offers a range of instruments to cover most of these applications, including Spectroscopic Ellipsometry for thin films, Raman Spectroscopy and Glow Discharge, as well as X-Ray Fluorescence for thicker films.
Techniques for Characterization of Interfaces
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