There may be many types of interfaces in a Solar device: interface between layers in a stack of films, interface with contacts and embedding materials or protective layers. HORIBA offers a range of instruments to cover most of these applications, including Spectroscopic Ellipsometry for thin films, Raman Spectroscopy and Glow Discharge, as well as X-Ray Fluorescence for thicker films.

• Raman Spectroscopy

  

  for measurement of relatively thick film of organic materials like polymers, or for measuring stress generated in Silicon based photovoltaics.
  
  
  
  

• Spectroscopic Ellipsometry (SE)

  

  for optical characterization and thickness measurement of thin or ultra thin film stacks.
  
  
  
  

• Glow Discharge Emission Spectroscopy

  

  for measurement of relatively thick film of compound materials or metals.