Solutions for Contact and Connection Materials
Contacts and connection materials, Transparent Conductive Oxydes (TCO) such as ZnO or SnO2 are as important as the photovoltaic materials themselves when it comes to efficiency. HORIBA offers a range of instruments covering a range of techniques used in multiple measurement requirements related to these materials.
Techniques useful for analysis of contact and connection materials
- Spectroscopic Ellipsometry (SE) for measurement of optical constants, thickness, roughness, bandgap etc...
- Raman Spectroscopy (RS) for offline or inline molecular composition analysis, thick films depth profiling, defect analysis.
- Photoluminescence (PL) and micro-PL for emission absorption and electro-luminescence.
- Fourier Transform Infra-Red (FT-IR) for molecular analysis of some polymers.
- X-Ray Fluorescence (XRF) for elemental analysis of some impurities.
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