Solutions for CIGS / CIS and other compound Photovoltaics Materials
CIS (Copper Indium Selenide), CIGS (Copper Indium Gallium Selenide), CdTe (Cadnium Teluride) and other similar compounds materials have proven to be viable alternatives to Silicon based Photovoltaic materials. HORIBA offers a range of instruments covering a range of techniques used in multiple measurement requirements related to these materials.
Solutions for...
Techniques useful for analysis of CIGS and other compounds Photovoltaic materials
- Raman Spectroscopy (RS) for offline or inline molecular composition analysis, especially GGI ratio measurement.
- Photoluminescence (PL) and micro-PL for bandgap measurement and electro-luminescence.
- Spectroscopic Ellipsometry (SE) for measurement of optical constants, thickness, roughness, bandgap etc...
- X-Ray Fluorescence (XRF) for bulk elemental composition analysis.
- Glow Discharge Optical Emission Spectroscopy (GD-OES) for elemental depth composition profiling.
- Time Correlated Single Photon Counting (TCSPC) for lifetime measurement.
- Gas and Liquid Mass Flow control (MFCs) for process liquid and gas monitoring.
| Call: | or ► E-mail us ◄ |
| USA: | +1 (732) 494-8660 Divisions ▼ |
| France: | Divisions ▼ |
| Germany: | +49 (0) 6251 / 84 75-0 |
| Italy: | +39 0 2 57603050 |
| Japan: | +81 (0) 3 38618231 |
| China: | +86 (0) 21 6289 6060 |
| Russia: | +7 495 221-87-71 / 72 or 73 |
| U.K.: | +44 (0) 20 8204 8142 |