A wide range of solutions for a wide range of applications

The Photovoltaic industry uses several types of materials, presenting different challenges that require different techniques. HORIBA offers solution to a wide range of application with products to respond to the challenges of most materials used in the Solar Industry.

Surface Composition Analysis, Crystallinity ratio

  • Technologies for measurement of crystallinity and amorphosity of Silicon based materials (a-Si, c-Si, p-Si), and ratios of compound photovoltaic materials such as GGI content (Ga/GaIn), CdS, CIS, SiC, GaAs...

Bulk Composition Measurement

  • Full range of systems to characterize CIS, CIGS and other compounds bulk composition, as well as Transparent Conductive Oxide (TCO) films, Silicones and Polymers.

Depth Profiling, multi layered film analysis

  • Solutions for profiling thin or thick films of Si photovoltaics, CIGS, CIS, CdS, organic photovoltaics PET, PEDOT:PSS, P3H, or embedding materials (Silicone, PET)

Bandgap Measurement

  • Solutions for measurement of bandgap of materials used in the photovoltaic industry.

Emission / Absoption Measurement

  • Solutions for analysis of Emission and Absorption of light in most Photovoltaic materials.

Measurement of Optical Constants (Absorption coefficient, dielectric constant, reflectance, transmittance)

  • Solutions for measurement of optical constants for most materials used in the photovoltaic industry.

Electro-Luminescence Measurement

  • Electro-Luminescence (EL) measurement solutions.

Quantum Efficiency Measurement

  • Solutions for measurement of Quantum Efficiency of photovoltaic films.

Lifetime Measurement

  • Solutions for Measurement of Lifetimes of Photovoltaic materials.

Film Thickness Measurements

  • Solutions for Film Thickness Measurement, as well as indexes of refraction and dielectric constant (n&k).

Film Roughness Measurement

  • Solutions for Measurement of Film Roughness.

Interface Characterization

  • Solutions for Characterization of Interfaces such as between protection layer and PV material, or TCO or other films and PV material.

Cracks, Defects and Impurities Characterization

  • Solutions for localization of cracks and defects, and chemical identification and quantification of defects and impurities.

Stress Characterization and Mapping

  • Solutions for Measuring and Imaging Stress.

Solar Simulator Characterization

  • Solutions to Characterize Solar Simulator Output.