Solutions for Bulk Composition Analysis
The Photovoltaic industry uses several types of materials, presenting different challenges that require different techniques. HORIBA offers a wide range of products to respond to the challenges of most materials used in the Solar Industry.
Techniques for bulk composition analysis
- Raman Spectroscopy (RS) for molecular characterization.
This technique is especially used to measure surface of materials (like crystallinity in silicon, or through transparent materials like polymers.
- X-Ray Fluorescence (XRF) for elemental composition analysis.
XRF is commonly used to measure bulk composition of CIGS and other compound materials
- Glow Discharge Optical Emission Spectroscopy (GD-OES) for elemental depth profiling of semiconductor compounds such as CIS, CIGS, CdTe or GaAs.
- Fourier Transform Infra-Red (FT-IR) for molecular characterization.
Products for bulk composition analysis
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