Solutions for Depth Profiling

Depth profiling can be done using elemental techniques that will provide elemental composition as a function of depth. It can also be done at the molecular level with materials that are fairly transparent to the wavelength used by the given technique, which will also influence the depth resolution. Alternatively, a stack of materials can be characterized in terms of optical constants and thickness with Spectroscopic Ellipsometry.

Techniques for Depth Profiling:


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