Spectroscopic Ellipsometry (SE) solutions
Spectroscopic Ellipsometry is a widely known technique for measuring optical constants of materials as well as thickness. It is also used for many other applications
A Solution for Measuring...
- Optical Constants of photovoltaic materials
- Optical Constants of Transparent Conductive Oxides (TCOs)
- Film Thickness for thin and ultra thin films
- Depth Profiling for thin films stacks and multi-layer materials
- Film Roughness, typically for the top layer.
- Bandgap by measurement of optical constants.
- Emission/Absorption of most materials
- InterfaceCharacterization
Use for...
Spectroscopic Ellipsometry Products:
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