Solutions for Embedding Materials
The Photovoltaic industry uses several types of materials for embedding cells into panels. HORIBA offers a range of techniques and intruments to measure interaction with the cell at the interface as well as characterization of the embedding materials for best performances.
Techniques useful for analysis of Embedding materials
- Raman Spectroscopy (RS) for offline or inline molecular composition analysis, thick films depth profiling, defect analysis.
- Photoluminescence (PL) and micro-PL for bandgap measurement and electro-luminescence.
- Fourier Transform Infra-Red (FT-IR) for molecular analysis of some polymers.
- Spectroscopic Ellipsometry (SE) for measurement of optical constants, thickness, roughness, bandgap etc...
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