Solutions for Surface Composition Analysis and Crystallinity Ratio Measurement

Surface composition is usually determined using optical techniques with narrow wavelength penetration depth in order to discriminate the surface from the substrate.

Raman Spectroscopy is especially useful for molecular analysis of surface composition, crystallinity and compounds ratio measurements.

Measurement of crystallinity of Silicon films

Crystalline Silicon (c-Si) has a sharp band easily recognized, while amorphous Silicon (a-Si) is a broader, shifted band on the side. The ratio of the 2 bands is easily measured by peak fitting.

Raman for measuring surface composition of CIGS, CIS and other compounds

Raman provides information on compounds relation concentration like GGI (Ga/GaIn ratio) in CIGS, and is able togive information on the crystalline phase.

Raman measures only surface composition and depth resolution depends on the choice of the laser used.

Raman for measuring composition of polymer films like PET, PEDOT:PSS...

Raman Spectroscopy is a great tool for distinguishing closely related polymers, as well as observing crystal orientation.

Thick films can be profiled, and composition measured with micron resolution.
Raman is also used to measure composition of Oxides and contact layers; any material except for metals, where X-Ray Fluorescence is better suited

Other techniques:

FT-IR is also a useful technique for polymer identification, while Spectroscopic Ellipsometry can give information on composition as well, although it is more geared towards measuring thickness and optical constants.

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