Surface composition is usually determined using optical techniques with narrow wavelength penetration depth in order to discriminate the surface from the substrate.

Raman Spectroscopy is especially useful for molecular analysis of surface composition, crystallinity and compounds ratio measurements.

Raman provides information on compounds relation concentration like GGI (Ga/GaIn ratio) in CIGS, and is able togive information on the crystalline phase.

Raman Spectroscopy is a great tool for distinguishing closely related polymers, as well as observing crystal orientation.

Thick films can be profiled, and composition measured with micron resolution.
Raman is also used to measure composition of Oxides and contact layers; any material except for metals, where X-Ray Fluorescence is better suited

FT-IR is also a useful technique for polymer identification, while Spectroscopic Ellipsometry can give information on composition as well, although it is more geared towards measuring thickness and optical constants.

• Silicon (Si) based Photovoltaics
• CIGS and other compound Photovoltaic (PV) Materials
• Organic Photovoltaic Materials
• Contact and Connection Materials